1. Wafer Testers for DRAM
| Tester | Advantest T5335P |
Advantest T5372 |
Advantest T5581H |
| Speed | 30 MHz | 143 MHz | 250 MHz |
| I/O, channel | 144 | 640 | 576 |
| Driver, channel | 480 | 1152 | 960 |
| Driver high voltage | Yes | Yes | Yes |
| AFM | 288M*4/1G*2 | 8G*8 | NA |
| Flash option | Yes/No | Yes | No |
| MRA utility | MRA2 | MRA4ev2 | NA |
| DC unit (standard/max.) | 16/16 | 32/32 | 32/32 |
| PPS unit (standard/max.) | 32/32 | 128/128 | 64/64 |
| Duts/System (max.) | 32 | 128 | 128 |
| Tester | Advantest T5377 |
Advantest T5377S |
Advantest T5593 |
| Speed | 143 MHz | 143 MHz | 1066 MHz |
| I/O, channel | 1280 | 1280 | 768 |
| Driver, channel | 2304 | 2304 | 768 |
| Driver high voltage | Yes | Yes | Yes |
| AFM | 8G*16/16G*16 | 8G*8/16G*8/32G*8 | NA |
| Flash option | Yes/No | Yes/No | No |
| MRA utility | MRA4ev2 | MRA4ev2 | NA |
| DC unit (standard/max.) | 64/64 | 128/128 | 32 |
| PPS unit (standard/max.) | 256/256 | 256/256 | 160 |
| Duts/System (max.) | 256 | 128 | 32 |
2. Wafer Testers for Flash
| Tester | Verigy V5400 | Verigy V6000 | Advantest T5830 |
| Flash type | NAND / NOR | NAND / NOR | NAND / NOR |
| Speed | 50/100 MHz | 280 MHz | 400 MHz |
| Site No | 144 | 256 | 64 |
| Max Channel | 4608 | 9216 | 9216 |
| PMU/site | 4 | 1 | 12 |
| PPS/site | 12 | 4 | 36 |
| OTA | ± 1 ns | ± 400 ps | ± 350 ps |
| Probe card interface | ZIF | Interposer | ZIF |
| Dut(Max) | 1152 | 2304 | 2304 |
3. Wafer Probers for Memory Test
| Prober | TEL P-8 | TEL P8-XL | TEL P12-XL |
| Wafer size | 8" | 8" | 8”, 12" |
| Contact Force | 20 Kg | 60 Kg | 100 Kg |
| Temperature range (standard) | 50~150°C | 50 ~ 150°C | 50 ~ 150°C |
| Temperature range (option) | N/A | -40 ~ 150°C | -55 ~ 150°C |
| Interface | GPIB | GPIB | GPIB |
| Prober | TSK UF3000 | TSK UF3000EX-e |
| Wafer size | 8", 12” | 8”, 12" |
| Contact Force | 100 Kg | 100 Kg |
| Temperature range (standard) | 25 ~ 150°C | 25 ~ 150°C |
| Temperature range (option) | -55 ~ 150°C | -55 ~ 150°C |
| Interface | GPIB | GPIB |
4. Support Systems for Memory Test
| Applications | Vendor | Model | |
| Probe Card Analyzer | 4500c/h | API | PRVX-3 |
| 10000c/h | API | Probe WoRx | |
| Wafer Inspection | 8" | Nikon | MWL860+L200 |
| 12" | Nikon | OST3100 | |
| 8”/12” | Leica | INS 300 | |
| 8”/12” | Camtek | Falcon 830 | |
| 8”/12” | Camtek | Condor | |
| Laser Repair | 8"/12" | ESI | ESI-9820 |
| 12" | ESI | ESI-9850TPIR | |
| UV | 8”/12” manual tray | Jelight | 2442 |
| Oven | Max. 350℃ | C-SUN | MOL-3S/HMOL-4S |
| Max. 350℃ | Despatch | LCD2 | |
| Max. 350℃ | Shiny | CLO-A7-T2NC | |
5. Wafer Testers for Display Driver IC (DDIC)
| Tester | Advantest T6371 | Advantest T6372 | Advantest T6373 | Advantest T6391 |
| Speed | 125MHz | 125 MHz | 125 MHz | 500 MHz |
| I/O, channel | 256 | 256 | 256 | 512 / 1024 |
| Driver, channel | 1280 | 1536 | 2304 | 2304 / 3584 |
| PPS unit (max.) | 16 | 16 | 32 | 48 / 160 |
| DC unit (max.) | 64 | 128 | 160 | 128 |
| Duts/System(max.) | 4 | 4 | 32 | 32 |
| Tester | Yokogawa TS670 | Yokogawa TS6730 | Diamond X | Teradyne J750 |
| Speed | 80 MHz | 250 MHz | 200 MHz | 800 MHz |
| I/O, channel | 112 | 64 x 2 (NSIO) 32 (HSIO) 14 pairs (DIHD) |
768 | 1024 |
| Driver, channel | 512 | 1334 | 2560 | 2416 |
| PPS unit (max.) | 4 | 8 | 120 | 24 |
| DC unit (max.) | 24 | 72 | 72 | 64 |
| Duts/System (max.) | 2 | 4 | 36 | 32 |
6. Wafer Probers for Display Driver IC (DDIC)
| Prober | TSK UF200A | TSK UF3000 | TSK UF3000EX-e |
| Wafer size | 8" | 8”, 12" | 8”, 12" |
| Contact Force | 60 Kg | 100 Kg | 100 Kg |
| Temperature range (standard) | 50~150°C | 25 ~ 150°C | 25 ~ 150°C |
| Temperature range (option) | N/A | -55 ~ 150°C | -55 ~ 150°C |
| Interface | GPIB | GPIB | GPIB |
7. Support Systems for Display Driver IC (DDIC)
| Applications | Vendor | Model | |
| Probe Card Analyzer | 4500c/h | API | PRVX-3 |
| 4500c/h | API | PRVX-4 | |
| Wafer Inspection | 12" | Nikon | OST3000 |
| UV | 6"/8" manual tray | Spectronics | PC-8820B |
| 8"/12" manual tray | Jelight | 2442 | |
| Oven | Max. 300℃ | C-SUN | MOL-2 |
| Max. 300℃ | C-SUN | MOL-3 | |
| Inker Machine | 8" | TSK | UF200A |
| 12" | TSK | UF3000 | |
| 12" | TSK | UF3000EX-e | |
8. Wafer Testers for Mixed-Signal IC
| Tester | HP/Verigy 93000-C400e | Advantest/Verigy 9300-PS400 | Advantest/Verigy9300-PS1600 | LTX -Credence D10 |
| Base Freq. | 100 MHz | 400 MHz | 400 MHz | 100 MHz |
| Data Rate | 400 Mbps | 533 Mbps | 1600 Mbps | 200 Mbps |
| Test Head | 1(LTH) | 1(CTH) | 1(CTH) | 1 |
| Digital Board | C400E/P1000 | PS400 | PS1600 | DPIN96 |
| Digital Pin Count | 512~896 Pins | 256~512 Pins | 384~640 Pins | 384~576 Pins |
| Vector Memory | 28M/56M/112M | 16M/32M | 16M/32M/64M | 16M/32M |
| DPS Power | GPDPS / MSDPS | MSDPS / DPS32 | DPS32 / DPS64 | DPS16 / VIS16 |
| Analog Module | WGA : 1M AWG WGB : 128M AWG WDA : 40M DIG WDB : 2M DIG AV8 : MCA TIA : Wavecrast |
AV8 : MCA/MCB | AV8 : MCB/MCE | MultiWave |
9. Wafer Probers for Mixed-Signal IC
| Prober | SEMICS OPUS-II | TSK UF200 | TSK UF300 | TSK UF3000 EXE |
| Wafer Size | 8", 12" | 8" | 8", 12" | 8", 12" |
| Temperature Range | 25℃ ~ 150℃ | -40℃ ~ 150℃ | 25℃ ~ 150℃ | -55℃ ~ 200℃ |
| Interface | GPIB | GPIB | GPIB | GPIB |
| Frame Prober | PlumFive PCP-101 |
| Frame Size | 8" frame |
| Temperature Range | 25℃ |
| Interface | GPIB |