1. Wafer Testers for DRAM
Tester Advantest
T5377
Advantest
T5377S
Speed 143 MHz 143 MHz
I/O, channel 1280 1280
Driver, channel 2304 2304
Driver high voltage Yes Yes
AFM 8G*16/16G*16 8G*8/16G*8/32G*8
Flash option Yes/No Yes/No
MRA utility MRA4ev2 MRA4ev2
DC unit (standard/max.) 64/64 128/128
PPS unit (standard/max.) 256/256 256/256
2. Wafer Testers for Flash
Tester Verigy V5400 Verigy V6000 Advantest T5830
Flash type NAND / NOR NAND / NOR NAND / NOR
Speed 50/100 MHz 280 MHz 400 MHz
Site No 144 256 64
Max Channel 4608 9216 9216
PMU/site 4 1 12
PPS/site 12 4 36
OTA ± 1 ns ± 400 ps ± 350 ps
Probe card interface ZIF Interposer ZIF
3. Wafer Probers for Memory Test
Prober TEL P12-XL TSK UF3000 TSK UF3000Ex TSK UF3000Ex-e TSK AP3000
Wafer size 8”, 12" 8”, 12" 8”, 12" 8”, 12" 8”, 12"
Contact Force 150 Kg 200 Kg 450 Kg 300 Kg 520 Kg
Temperature range (standard) 30~150°C 15 ~ 150°C 15 ~ 150°C 15 ~ 150°C -55 ~ 150°C
Temperature range (option) -40 ~ 150°C -55 ~ 150°C -55 ~ 150°C -55 ~ 150°C -55 ~ 150°C
Interface GPIB GPIB GPIB GPIB GPIB
4. Support Systems for Memory Test
Applications Vendor Model
Probe Card Analyzer 4500c/h API PRVX-3
Wafer Inspection 8" Nikon MWL860+L200
12" Nikon OST3100
8”/12” Camtek Falcon 830
8”/12” Camtek Condor
Laser Repair 8"/12" ESI ESI-9820
12" ESI ESI-9850TPIR
UV 8”/12” manual tray Jelight 2442
Oven Max. 350℃ C-SUN MOL-3S/HMOL-4S
Max. 350℃ Despatch LCD2
Max. 350℃ Shiny CLO-A7-T2NC
5. Wafer Testers for Display Driver IC (DDIC)
Tester Advantest T6371 Advantest T6372 Advantest T6373 Advantest T6391
Speed 500 Mbps 875 Mbps 875 Mbps 1.6 Gbps
I/O, channel 256 256 256 512 / 1024
Driver, channel 1280 1536 2304 2304 / 3072/ 3584
PPS unit (max.) 16 16 32 24 / 160
DC unit (max.) 64 128 160 128
Duts/System(max.) 4 4 32 32
Tester Yokogawa TS670 Yokogawa TS6730 Diamond X
Speed 60 MHz 250 MHz 1 Gbps
I/O, channel 112 256 768
Driver, channel 736 1344 2560
PPS unit (max.) 4 8 72
DC unit (max.) 24 72 48
Duts/System (max.) 2 4 256
6. Wafer Probers for Display Driver IC (DDIC)
Prober TSK UF200A TSK UF3000 TSK UF3000EX-e TSK AP3000e
Wafer size 8" 8”, 12" 8”, 12" 8”, 12"
Temperature range (standard) 25~150°C 25 ~ 150°C 25 ~ 150°C 25 ~ 150°C
Temperature range (option) N/A -55 ~ 150°C -55 ~ 150°C -55 ~ 150°C
Interface GPIB GPIB GPIB GPIB
7. Support Systems for Display Driver IC (DDIC)
Applications Vendor Model
Probe Card Analyzer 4500c/h API PRVX-3
4500c/h API PRVX-4
Wafer Inspection 12" Nikon OST3000
UV 8"/12" manual tray Jelight 2442
Oven Max. 300℃ C-SUN MOL-3
Inker Machine 8" TSK UF200A
12" TSK UF3000
12" TSK UF3000EX-e
8. Wafer Testers for Mixed-Signal IC
Tester HP/Verigy HP93000-C400e Advantest/Verigy  PS400 Advantest PS1600 LTX -Credence D10
Base Freq. 100 MHz 400 MHz 400 MHz 100 MHz
Data Rate 400 Mbps 400 Mbps 1600 Mbps 200 Mbps
Test Head 1(LTH) 1(CTH) 1(CTH) 1
Digital Board C400E/P1000 PS400 PS1600 DPIN96
Digital Pin Count 512~896 Pins 384~512 Pins 512~1024 Pins 480~768 Pins
Vector Memory 28M/56M/112M 16M/32M 16M/32M/64M/112M 16M/32M
DPS Power GPDPS / MSDPS MSDPS / DPS32 DPS32 / DPS64 / DPS128 DPS16 / VIS16
Analog Module WGA : 1M AWG
WGB : 128M AWG
WDA : 40M DIG
WDB : 2M DIG
AV8 : MCA
TIA : Wavecrast
AV8 : MCA/MCB AV8 : MCB/MCE/AVI64/FVI16 MultiWave
9. Wafer Probers for Mixed-Signal IC
Prober PlumFive PCP-101 SEMICS OPUS-II TSK UF200 TSK UF3000 series
Wafer Size 8" frame 8", 12" 8" 8", 12"
Temperature Range 25℃ 25℃ ~ 150℃ 25℃ ~ 150℃ -40℃
25℃ ~ 175℃
Interface GPIB GPIB GPIB GPIB