Reliability and Failure Analysis

International and/or customer defined reliability tests are well designed into ChipMOS qualification system, such as new package, engineering or process change qualification and periodical production process monitor. All tests are conducted following required procedure and conditions as per JEDEC and MIL-STD (Military Standard) standards. We provide in-time analysis as well to locate and identify source of failure while any non-conformance found from production or reliability tests. Meanwhile, we are TAF (Taiwan Accreditation Foundation) qualified member in package reliability testing scope and chemical analysis scope.