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ChipMOS / Taiwan
1. Memory Testers
Tester Advantest T5371 Advantest T5375/77 Advantest T5365
Speed 70 MHz 142.8 MHz 60 MHz
I/O, channel 640 1280 288
Driver, channel 960 2048 576
MRA utility MRA 4 MRA 4 N/A
PPS unit (standard/max.) 64/128 256/256 32/64
DC unit (standard/max.) 16/32 64/64 16/32
Duts/System (max.) 64/128 (AD) 128/256 (AD) 64
Tester Advantest T5581H Advantest T5585 Advantest T5588 Advantest T5593
Speed 250 MHz 250 MHz
500Mbps (DDR mode)		 400MHz
800Mbps (DDR mode)		 533MHz
1066Mbps (DDR mode)
I/O, channel 576 1152 3072 1536
Driver, channel 960 1536 3584 1536
MRA utility N/A N/A N/A N/A
PPS unit (standard/max.) 64/64 192/192 512/512 320/320
DC unit (standard/max.) 32/32 64/64 64/64 64/64
Duts/System (max.) 64/128 (AD) 128/256 (AD) 256 256
Tester Advantest T5503A Advantest T5503HS Advantest T5503HS2
Speed 1.143GHz
2.286Gbps (DDR mode)		 2.25GHz
4.511Gbps (DDR mode)		 4.5GHz
9Gbps (DDR mode)
I/O, channel 3072 8064 11392
Driver, channel 2688 2240 NA
MRA utility NA NA NA
PPS unit (standard/max.) 512/1024 1024/2014 1536/1536
DC unit (standard/max.) 128/128 128/128 448/448
Duts/System (max.) 512 512 512
2. Handlers for Memory Test
Hanlder Advantest
M6541A/AD		 Advantest
M6741A/AD		 Advantest
M6751A/AD
Feeding speed (1BIN,Offline) 6000 device/hr 3300 device/hr 4500 device/hr
Heating system Chamber
heating		 Chamber
heating		 Chamber
heating
Temperature range
standard
option
-30 ~ 125°C
-55 ~ 125°C
-30 ~ 125°C
-55 ~ 125°C
-30 ~ 125°C
-55 ~ 125°C
Interface GPIB GPIB GPIB
Hanlder Advantest
M6542AD		 Advantest
M6300/AD		 Advantest
M6242/AD
Feeding speed (1BIN,Offline) 6200 device/hr 12,000 device/hr 42,200 device/hr
Heating system Chamber
heating		 Chamber
heating		 Chamber
heating
Temperature range
standard
option
-30 ~ 125°C
-55 ~ 125°C
-30 ~ 125°C
-55 ~ 125°C
-30 ~ 125°C
-55 ~ 125°C
Interface GPIB GPIB GPIB
Hanlder SRM XD-248 SRM Z-248 SRM Z-328
Feeding speed (1BIN,Offline) 36,000 device/hr 40,000 device/hr 24,000 device/hr
Heating system NA NA NA
Temperature range
standard
option		 NA NA NA
Interface GPIB GPIB GPIB
3. Support Systems of Memory Test
 Application System Remark
MFG Model
Inspection TSOP/QFP/BGA/SOP ICOS T120/T790  
TSOP/QFP/BGA/SOP TFS 5000/2820/350  
SOP SRM Z248T  
Packing TSOP/QFP/BGA/SOP Shinron MVI-608 Baking Oven
TSOP/QFP/BGA/SOP JIY FUN JF-300 Packing
TSOP/QFP/BGA/SOP JIY FUN JF-900A Vacuum packing
Burn-In Oven SDRAM/SSRAM/DDR/FLASH SSE B1120M  Dynamic B/I Oven
SDRAM/SSRAM/DDR/FLASH JEC 3502 Monitor /TDBI B/I Oven
SDRAM/SSRAM/DDR/FLASH ANDO AF8652D5 Monitor /TDBI B/I Oven
SDRAM/SSRAM/DDR/FLASH/MaskROM ANDO AF8652D6 Monitor /TDBI B/I Oven
Loader/Unloader TSOP/QFP/BGA/SOP Prov PPLU-600 Pick & Place
TSOP/QFP/BGA/SOP Prov PPLU-800 Pick & Place
Marking TSOP/QFP/BGA/SOP Prov TTLM10000_ER40 Laser Marker
TSOP/QFP/BGA/SOP EO BM402/364 Laser Marker
4. Testers for Display Driver IC (DDIC)
Tester Advantest T6372 Advantest T6373 Advantest T6391
Speed 875 Mbps 875 Mbps 1.6 Gbps
I/O, channel 256 256 512
Driver, channel 1536 2304 2304 / 3072 / 3584
PPS unit (max.) 16 32 24 / 160
DC unit (max.) 128 160 128
Duts/System(max.) 4 32 32
Tester Yokogawa TS670 Yokogawa TS6730 Diamond X
Speed 60 MHz 250 MHz 1 Gbps
I/O, channel 112 256 768
Driver, channel 736 1344 2560
PPS unit (max.) 4 8 72
DC unit (max.) 24 72 48
Duts/System (max.) 2 4 256
5. COF Handlers for Display Driver IC (DDIC) Test
COF Handler TESEC AHM-861 TESEC AH-9610 TESEC AH-9710 TAKAYA TFH-1800 HONTECH HT-6000
Docking tester Yokogawa TS670 Advantest T6372 Advantest T6371
Advantest T6372
Advantest T6373
Advantest T6391
Diamond X
Yokogawa ST6730		 Advantest T6371
Advantest T6372
Advantest T6373
Yokogawa ST6730		 Advantest T6371
Advantest T6372
Advantest T6373
Advantest T6391
Diamond X
Yokogawa ST6730
COF Tape width 35 / 48 /70 mm W/ SW 35 / 48 /70 mm W/ SW 35 / 48 /70 mm W/ SW 35 / 48 /70 mm W/ SW 35 / 48 /70 mm W/ SW
DUT type Dual Dual 8 4 Dual
Temperature 25~110°C 25~110°C 25~110°C -40~115°C -40~125°C
Interface TTL TTL / GPIB GPIB TTL / GPIB GPIB
6. Testers for Mixed-Signal
Tester HP/Verigy HP93000-C400e Advantest/Verigy  PS400 Advantest PS1600 LTX -Credence D10
Base Freq. 100 MHz 400 MHz 400 MHz 100 MHz
Data Rate 400 Mbps 400 Mbps 1600 Mbps 200 Mbps
Test Head 1(LTH) 1(CTH) 1(CTH) 1
Digital Board C400E/P1000 PS400/PS3600 PS1600/PS9G/PSSL DPIN96
Digital Pin Count 512~896 Pins 448~512 Pins 512~1152 Pins 480~768 Pins
Vector Memory 28M/56M/112M 16M/32M 16M/32M/64M/112M 16M/32M
DPS Power GPDPS / MSDPS MSDPS / DPS32 DPS32 / DPS64 / DPS128 DPS16 / VIS16
Analog Module WGA : 1M AWG
WGB : 128M AWG
WDA : 40M DIG
WDB : 2M DIG
AV8 : MCA
TIA : Wavecrast		 AV8 : MCA/MCB AV8 : MCB/MCE/AVI64/FVI16 MultiWave
7. Handlers for Mixed-Signal Test
Handler Seiko Epson
NS-6040		 Seiko Epson
NS-8040		 Seiko Epson
NS-8080		 JHT
Exceed 6080
Device Type QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN
Test Mode Single/Dual/Quad Single/Dual/Quad Single/Dual/Quad/Octal Single/Dual/Quad/Octal
Temperature 25~130°C 25~130°C 25~130°C 25~130°C
Handler Hon-Tek
HT 7045		 Hon-Tek
HT 9045		 Hon-Tek
HT 1028C		 JHT
Exceed 8008
Device Type QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN QFP, TSOP, PGA, BGA, PLCC, QFN
Test Mode Single/Dual/Quad Single/Dual/Quad/Octal Single/Dual/Quad/Octal Single/Dual/Quad/Octal
Temperature 25~130°C 25~130°C -40°C
25~130°C		 25~130°C
8. Support Systems of Mixed-Signal Test
 Application System Remark
MFG Model
Inspection TSOP/QFP/BGA ICOS 9450/T120  
TSOP/QFP/BGA/QFN ICOS T790  
TSOP/QFP/QFN OPTI 6100  
TSOP/QFP/BGA/QFN STI TR48-MKIV Tape & Reel
Packing TSOP/QFP/BGA/QFN Maiiler IGOH-2M-RH Baking Oven
TSOP/QFP/BGA/QFN Shiny NX0-B3/NX0-B5 Backing Oven
TSOP/QFP/BGA/QFN JIY FUN JF-300/JF-325 Strappig machine
TSOP/QFP/BGA/QFN JIY FUN JF-680A/JF-900A Vacuum packing