1. Wafer Testers for DRAM
| Tester | Advantest T5377 |
Advantest T5377S |
| Speed | 143 MHz | 143 MHz |
| I/O, channel | 1280 | 1280 |
| Driver, channel | 2304 | 2304 |
| Driver high voltage | Yes | Yes |
| AFM | 8G*16/16G*16 | 8G*8/16G*8/32G*8 |
| Flash option | Yes/No | Yes/No |
| MRA utility | MRA4ev2 | MRA4ev2 |
| DC unit (standard/max.) | 64/64 | 128/128 |
| PPS unit (standard/max.) | 256/256 | 256/256 |
2. Wafer Testers for Flash
| Tester | Verigy V5400 | Verigy V6000 | Advantest T5830 |
| Flash type | NAND / NOR | NAND / NOR | NAND / NOR |
| Speed | 50/100 MHz | 280 MHz | 300 MHz |
| Site No | 144 | 256 | 64 |
| Max Channel | 4608 | 9216 | 9216 |
| PMU/site | 4 | 1 | 12 |
| PPS/site | 12 | 4 | 36 |
| OTA | ± 1 ns | ± 400 ps | ± 400 ps |
| Probe card interface | ZIF | Interposer | ZIF |
3. Wafer Probers for Memory Test
| Prober | TEL P12-XL | TSK UF3000 | TSK UF3000Ex | TSK UF3000Ex-e | TSK AP3000 |
| Wafer size | 8”, 12" | 8”, 12" | 8”, 12" | 8”, 12" | 8”, 12" |
| Contact Force | 150 Kg | 200 Kg | 450 Kg | 300 Kg | 520 Kg |
| Temperature range (standard) | 30 ~ 150°C | 15 ~ 150°C | 15 ~ 150°C | 15 ~ 150°C | 15 ~ 150°C |
| Temperature range (option) | -40 ~ 150°C | -55 ~ 150°C | -55 ~ 150°C | -55 ~ 150°C | -55 ~ 150°C |
| Interface | GPIB | GPIB | GPIB | GPIB | GPIB |
4. Support Systems for Memory Test
| Applications | Vendor | Model | |
| Probe Card Analyzer | 4500c/h | API | PRVX-3 |
| Wafer Inspection | 8" | Nikon | MWL860+L200 |
| 12" | Nikon | OST3100 | |
| 8”/12” | Camtek | Falcon 830 | |
| 8”/12” | Camtek | Condor | |
| 8”/12” | Camtek | EagleT-AP Plus | |
| Laser Repair | 8"/12" | ESI | ESI-9820 |
| 12" | ESI | ESI-9850TPIR | |
| UV | 8”/12” manual tray | Jelight | 2442 |
| Oven | Max. 350℃ | C-SUN | MOL-3S/HMOL-4S |
| Max. 350℃ | Despatch | LCD2 | |
| Max. 350℃ | Shiny | CLO-A7-T2NC | |
| Max. 350℃ | WeiSun | HWOL-6-A01 | |
5. Wafer Testers for Display Driver IC (DDIC)
| Tester | Advantest T6371 | Advantest T6372 | Advantest T6373 | Advantest T6391 |
| Speed | 500 Mbps | 875 Mbps | 875 Mbps | 1.6 Gbps |
| I/O, channel | 256 | 256 | 256 | 512 / 1024 |
| Driver, channel | 1280 | 1536 | 2304 | 2304 / 3072/ 3584 |
| PPS unit (max.) | 16 | 16 | 32 | 24 / 160 |
| DC unit (max.) | 64 | 128 | 160 | 128 |
| Duts/System(max.) | 4 | 4 | 32 | 32 |
| Tester | Yokogawa TS670 | Yokogawa TS6730 | Diamond X |
| Speed | 60 MHz | 250 MHz | 1 Gbps |
| I/O, channel | 112 | 256 | 768 |
| Driver, channel | 736 | 1344 | 2560 |
| PPS unit (max.) | 4 | 8 | 72 |
| DC unit (max.) | 24 | 72 | 48 |
| Duts/System (max.) | 2 | 4 | 256 |
6. Wafer Probers for Display Driver IC (DDIC)
| Prober | TSK UF200A | TSK UF3000 | TSK UF3000EX-e | TSK AP3000e |
| Wafer size | 8" | 8”, 12" | 8”, 12" | 8”, 12" |
| Temperature range (standard) | 25~150°C | 25 ~ 150°C | 25 ~ 150°C | 25 ~ 150°C |
| Temperature range (option) | N/A | -55 ~ 150°C | -55 ~ 150°C | -55 ~ 150°C |
| Interface | GPIB | GPIB | GPIB | GPIB |
7. Support Systems for Display Driver IC (DDIC)
| Applications | Vendor | Model | |
| Probe Card Analyzer | 4500c/h | API | PRVX-3 |
| 4500c/h | API | PRVX-4 | |
| Wafer Inspection | 12" | Nikon | OST3000 |
| UV | 8"/12" manual tray | Jelight | 2442 |
| Oven | Max. 300℃ | C-SUN | MOL-3 |
| Inker Machine | 8" | TSK | UF200A |
| 12" | TSK | UF3000 | |
| 12" | TSK | UF3000EX-e | |
8. Wafer Testers for Mixed-Signal IC
| Tester | Advantest/Verigy PS400 | Advantest PS1600 | Advantest EXA Scale | LTX -Credence D10 |
| Base Freq. | 400 MHz | 400 MHz | 400 MHz | 100 MHz |
| Data Rate | 400 Mbps | 1600 Mbps | 9000 Mbps (Max) | 200 Mbps |
| Test Head | CTH | CTH | STH | 10 Slot |
| Digital Board | PS400/PS3600 | PS1600/PS9G/PSSL | PS1600/PS5000/PS9000/PSMLS | DPIN96 |
| Digital Pin Count | 448~512 Pins | 512~1152 Pins | 512~1152 Pins | 480~768 Pins |
| Vector Memory | 16M/32M | 16M/32M/64M/112M | 16M/32M/64M/112M | 16M/32M |
| DPS Power | MSDPS/DPS32 | DPS32/DPS64/DPS128 AVI64/FVI16 |
XPS128/XPS256/XHC32 AVI64/FVI16 |
DPS16/VIS16 |
| Analog Module | AV8 : MCA/MCB | AV8 : MCB/MCE/MCL | Wave Scale | MultiWave |
9. Wafer Probers for Mixed-Signal IC
| Prober | PlumFive PCP-101 | SEMICS OPUS-II | TSK UF200 | TSK UF3000 series |
| Wafer Size | 8" frame | 8", 12" | 8" | 8", 12" |
| Temperature Range | 25℃ | 25℃ ~ 150℃ | 25℃ ~ 150℃ | -40℃ 25℃ ~ 175℃ |
| Interface | GPIB | GPIB | GPIB | GPIB |